MECH 3025: Scanning Electron Microscopy

Designed for use in a geology course, this manual provides a useful guide to image changes caused by interactions between the electron probe and specimen.

Provides instructions and methods for improving the quality of SEM images.

Free access to current articles and back issues.

Free access to peer-reviewed, open access articles on SEM.

Basic knowledge for using the SEM.

"EM resources and reference materials for microscopy novices, experts, and everyone in between."